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About this Physics and Astronomy article
Precise Total Electron Yield Measurements for Impact of Singly or Multiply Charged Ions on Clean Solid Surfaces by Eder, H.; Vana, M.; Aumayr, F.; Winter, H. P. is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Eder, H.; Vana, M.; Aumayr, F.; Winter, H. P.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0034-6748)
- Published
- 1997
- Field
- Physics and Astronomy (Physical Sciences)
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