Can I read Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (SpringerBriefs in Applied Sciences and Technology) on EtoBox?

Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (SpringerBriefs in Applied Sciences and Technology) by Nicolas Brodusch,Hendrix Demers,Raynald Gauvin (auth.) is a nonfiction available to read on EtoBox.

What is Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (SpringerBriefs in Applied Sciences and Technology) about?

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning- ) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage

Who reads Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (SpringerBriefs in Applied Sciences and Technology)?

Author

Nicolas Brodusch,Hendrix Demers,Raynald Gauvin (auth.)

Publisher

Springer Singapore : Imprint: Springer

Published

2018

Language

EN

ISBN

9789811044335

Category

nonfiction

Subjects

Technology, Science, Chemistry