Can I read Design Trade-Offs of A 6T Finfet Sram Cell in The Presence of Variations on EtoBox?
Design Trade-Offs of A 6T Finfet Sram Cell in The Presence of Variations by movie1_ec is a document available to read on EtoBox.
What is Design Trade-Offs of A 6T Finfet Sram Cell in The Presence of Variations about?
Increase in process variation in short channel transistors is reducing the robustness of bulk-FET based SRAM designs. Process variations in the fabrication of short channel FinFETs introduce significant variations in on / off currents resulting in a variable circuit performance. An optimal design strategy of SRAM should consider minimization of area and access times in conjunction with reducing the failure probabilities due to variations.
- Author
- movie1_ec
- Language
- EN