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About this Materials Science article
Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices by Todorov, R.; Tasseva, J.; Lozanova, V.; Lalova, A.; Iliev, Tz.; Paneva, A. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Todorov, R.; Tasseva, J.; Lozanova, V.; Lalova, A.; Iliev, Tz.; Paneva, A.
- Publisher
- Hindawi Limited; Hindawi Publishing Corporation; New York NY: Hindawi Publ.; London: Hindawi (ISSN 1687-8108)
- Published
- 2013
- Language
- EN
- Field
- Materials Science (Physical Sciences)
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