About this scholarly article

International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Circular BIST with partial scan by Pradhan, M.M.; O'Brien, E.J.; Lam, S.L.; Beausang, J. is a scholarly article available to read on EtoBox.

Author

Pradhan, M.M.; O'Brien, E.J.; Lam, S.L.; Beausang, J.

Publisher

IEEE Comput. Soc. Press

Published

1988

Language

EN