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About this Engineering article

Growth and characterization of totally relaxed InGaAs thick layers on strain-relaxed paramorphic InP substrates by Mouloud Boudaa; P. Regreny; J. L. Leclercq; M. P. Besland; O. Marty; G. Hollinger is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Mouloud Boudaa; P. Regreny; J. L. Leclercq; M. P. Besland; O. Marty; G. Hollinger
Publisher
Springer US; Springer-Verlag; Springer New York LLC; Springer Science and Business Media LLC (ISSN 0361-5235)
Published
2004
Language
EN
Field
Engineering (Physical Sciences)

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