About this scholarly article

2020 IEEE Silicon Nanoelectronics Workshop (SNW) - 3840x Reliability Enhanced Robust NAND flash Optimized to Store Weight Data for Object Detection and Semantic Segmentation of Self-driving Car at High Temperature by Mizushina, Keita; Suzuki, Shun; Aihara, Hiroki; Takeuchi, Ken is a scholarly article available to read on EtoBox.

Author

Mizushina, Keita; Suzuki, Shun; Aihara, Hiroki; Takeuchi, Ken

Publisher

IEEE

Published

2020