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About this Engineering article
Dual-Mode RFID Tag IC Supporting Gen-2 and Visible RFID Modes Using a Process-Compensating Self-Calibrating Clock Generator by Din, Amad Ud; Lee, Jae-Hun; Hieu, Nguyen Xuan; Lee, Jong-Wook is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Din, Amad Ud; Lee, Jae-Hun; Hieu, Nguyen Xuan; Lee, Jong-Wook
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electoronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1932-4529)
- Published
- 2020
- Field
- Engineering (Physical Sciences)
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