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Metal-organic chemical vapor deposition/open flow thallium annealing route to epitaxial Tl2Ba2Ca2Cu3O10 thin films by Hinds, B. J.; Schulz, D. L.; Neumayer, D. A.; Han, B.; Marks, T. J.; Wang, Y. Y.; Dravid, V. P.; Schindler, J. L.; Hogan, T. P.; Kannewurf, C. R. is a Engineering article available to read on EtoBox.

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Author
Hinds, B. J.; Schulz, D. L.; Neumayer, D. A.; Han, B.; Marks, T. J.; Wang, Y. Y.; Dravid, V. P.; Schindler, J. L.; Hogan, T. P.; Kannewurf, C. R.
Publisher
American Institute of Physics; AIP Publishing (ISSN 0003-6951)
Published
1994
Language
EN
Field
Engineering (Physical Sciences)

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Browse all works by Hinds, B. J.; Schulz, D. L.; Neumayer, D. A.; Han, B.; Marks, T. J.; Wang, Y. Y.; Dravid, V. P.; Schindler, J. L.; Hogan, T. P.; Kannewurf, C. R.