About this scholarly article

2009 International Symposium on VLSI Design, Automation and Test - An efficient multi-phase test technique to perfectly prevent over-detection of acceptable faults for optimal yield improvement via error-tolerance by Hsieh, Tong-Yu; Lee, Kuen-Jong; Breuer, Melvin A. is a scholarly article available to read on EtoBox.

Author

Hsieh, Tong-Yu; Lee, Kuen-Jong; Breuer, Melvin A.

Publisher

IEEE

Published

2009

Language

EN