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About this Engineering article
An Improved Attributed Scattering Model Optimized by Incremental Sparse Bayesian Learning by Li, Zenghui; Jin, Kan; Xu, Bin; Zhou, Wei; Yang, Jian is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Li, Zenghui; Jin, Kan; Xu, Bin; Zhou, Wei; Yang, Jian
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0196-2892)
- Published
- 2016
- Language
- EN
- Field
- Engineering (Physical Sciences)