About this scholarly article

SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Wavelet Applications in Signal and Image Processing VII - Wavelets in the Bayesian change-point analysis by Ogden, R. Todd; Unser, Michael A.; Aldroubi, Akram; Laine, Andrew F. is a scholarly article available to read on EtoBox.

Author

Ogden, R. Todd; Unser, Michael A.; Aldroubi, Akram; Laine, Andrew F.

Publisher

SPIE

Published

1999

Language

EN