About this scholarly article

SPIE Proceedings [SPIE Fifth International Conference on Correlation Optics - Chernivsti, Ukraine (Thursday 10 May 2001)] Selected Papers from Fifth International Conference on Correlation Optics - Small optical device for measurement of surface roughness by Mendeleev, Vladimir Y.; Skovorod'ko, Sergey N.; Porotov, Vladimir N.; Kim, Konstantin Y.; Angelsky, Oleg V. is a scholarly article available to read on EtoBox.

Author

Mendeleev, Vladimir Y.; Skovorod'ko, Sergey N.; Porotov, Vladimir N.; Kim, Konstantin Y.; Angelsky, Oleg V.

Publisher

SPIE

Published

2002

Language

EN