Opening book details…
About this Engineering article
Atomic Force Microscopy for Nanoscale Mechanical Property Characterization by Stan, Gheorghe; King, Sean W. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Stan, Gheorghe; King, Sean W.
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics; AVS Science and Technology Society (ISSN 1520-8567)
- Published
- 2020
- Field
- Engineering (Physical Sciences)