About this scholarly article

SPIE Proceedings [SPIE SPIE Defense + Security - Anaheim, California, United States (Sunday 9 April 2017)] Sensors and Systems for Space Applications X - The analysis of the defects of the view field of the UV image intensifier by Pham, Khanh D.; Chen, Genshe; Fu, RongGuo; Wei, YiFang; Yang, Qi; Yang, Xu; Wang, GuiYuan is a scholarly article available to read on EtoBox.

Author

Pham, Khanh D.; Chen, Genshe; Fu, RongGuo; Wei, YiFang; Yang, Qi; Yang, Xu; Wang, GuiYuan

Publisher

SPIE

Published

2017

Language

EN