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About this Engineering article
Non-destructive Detection of Screw Dislocations and the Corresponding Defects Nucleated from Them During SiC Epitaxial Growth and Their Effect on Device Characteristics by Das, H.; Sunkari, S.; Naas, H. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Das, H.; Sunkari, S.; Naas, H.
- Publisher
- Springer US; Springer-Verlag; Springer New York LLC; Springer Science and Business Media LLC (ISSN 0361-5235)
- Published
- 2018
- Language
- EN
- Field
- Engineering (Physical Sciences)