Opening book details…
Can I read Advanced Interconnects for ULSI Technology: Baklanov/Advanced Interconnects for ULSI Technology on EtoBox?
Advanced Interconnects for ULSI Technology: Baklanov/Advanced Interconnects for ULSI Technology by Baklanov, Mikhail R. (editor);Ho, Paul S. (editor);Zschech, Ehrenfried (editor) is a nonfiction available to read on EtoBox.
What is Advanced Interconnects for ULSI Technology: Baklanov/Advanced Interconnects for ULSI Technology about?
Finding new materials for copper/low-k interconnects is critical to the continuing development of computer chips. While copper/low-k interconnects have served well, allowing for the creation of Ultra Large Scale Integration (ULSI) devices which combine over a billion transistors onto a single chip, the increased resistance and RC-delay at the smaller scale has become a significant factor affecting chip performance. Advanced Interconnects for ULSI Technology is dedicated to the materials and methods which might be suitable replacements. It covers a broad range of topics, from physical principles to design, fabrication, characterization, and application of new materials for nano-interconnects, and discusses: Interconnect functions, characterisations, electrical properties and wiring requirements Low-k materials: fundamentals, advances and mechanical properties Conductive layers and barriers Integration and reliability including mechanical reliability, electromigration and electrical breakdown New approaches including 3D, optical, wireless interchip, and carbon-based interconnects Intended for postgraduate students and researchers, in academia and industry, this book pr
Who reads Advanced Interconnects for ULSI Technology: Baklanov/Advanced Interconnects for ULSI Technology?
It is typically read by self-directed learners exploring a subject in depth.
Common subject areas: history, science, philosophy, social sciences.
- Author
- Baklanov, Mikhail R. (editor);Ho, Paul S. (editor);Zschech, Ehrenfried (editor)
- Publisher
- John Wiley & Sons, Ltd
- Published
- 2012
- Language
- EN
- ISBN
- 9781119963240
- Category
- nonfiction
- Subjects
- Engineering, Technology, Stem
More by Baklanov, Mikhail R. (editor);Ho, Paul S. (editor);Zschech, Ehrenfried (editor)
Browse all works by Baklanov, Mikhail R. (editor);Ho, Paul S. (editor);Zschech, Ehrenfried (editor)
Similar books
- Advanced Nanoscale ULSI Interconnects : Fundamentals and Applications — Y. Shacham-Diamand (auth.), Yosi Shacham-Diamand, Tetsuya Osaka, Madhav Datta, Takayuki Ohba (2009)
- Ulsi Technology — C. Y. Chang, S. M. Sze (1996)
- ULSI Semiconductor Technology Atlas — Chih-Hang Tung, George T. Sheng, Chih-Yuan Lu (2003)
- Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings) — David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, W. Murray Bullis, Patrick J. Smith, Erik M. Secula (2001)
- Advanced Ta-Based Diffusion Barriers for Cu Interconnects — René Hübner (2009)
- ULSI Devices — C. Y. Chang; Simon M. Sze (2000)
