Skip to content

Opening book details…

About this Engineering article

Relationship between Trace Mn and the Pitting Behavior of Aluminum Foil Used for High Voltage Electrolytic Capacitors by Hong, Zuo; Chunming, Liu is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Hong, Zuo; Chunming, Liu
Publisher
Elsevier ; Elsevier BV (ISSN 1875-5372)
Published
2014
Field
Engineering (Physical Sciences)

More by Hong, Zuo; Chunming, Liu

Browse all works by Hong, Zuo; Chunming, Liu