About this scholarly article

2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Defect probability of directed self-assembly lithography: Fast identification and post-placement optimization by Shim, Seongbo; Chung, Woohyun; Shin, Youngsoo is a scholarly article available to read on EtoBox.

Author

Shim, Seongbo; Chung, Woohyun; Shin, Youngsoo

Publisher

IEEE

Published

2015

Language

EN