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What is Four Probe Method for Semiconductor Resistivity about?

This document describes the four probe method for determining the resistivity of semiconductors. The four probe method uses four probes arranged linearly on the sample surface to pass a constant current through the outer two probes and measure the voltage across the inner two probes. This allows the resistivity of the sample to be calculated based on the spacing between the probes, the measured voltage and current. The resistivity is also dependent on temperature, decreasing with increasing temperature due

Author

Amit Mandal

Language

EN