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About this Engineering article
Single event induced charge transport modeling of GaAs MESFETs by Weatherford, T.R.; McMorrow, D.; Curtice, W.R.; Knudson, A.R.; Campbell, A.B. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Weatherford, T.R.; McMorrow, D.; Curtice, W.R.; Knudson, A.R.; Campbell, A.B.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 1993
- Language
- EN
- Field
- Engineering (Physical Sciences)
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