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About this Engineering article
Measurement of Layer Thickness and Permittivity Using a New Multilayer Model From GPR Data by Chien-Ping Kao; Jing Li; Ying Wang; Huichun Xing; Ce Richard Liu is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chien-Ping Kao; Jing Li; Ying Wang; Huichun Xing; Ce Richard Liu
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0196-2892)
- Published
- 2007
- Language
- EN
- Field
- Engineering (Physical Sciences)
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