About this document

BEEM Study of Charge Transport in Au/GO/m-Si by rskajen is a document available to read on EtoBox.

This study utilizes ballistic electron emission microscopy to investigate charge transport across an Au/graphene-oxide/modified-silicon stack, revealing a non-homogeneous Au/GO interface with average injection barriers of 1.0 eV for electrons and 0.5 eV for holes. The findings suggest that variations in barrier heights are influenced by the thickness of graphene oxide layers and the presence of functional groups. These insights are significant for the design of graphene-based electronic devices.

Author

rskajen

Language

EN