Can I read Failure Mechanisms in MEMS/NEMS Devices on EtoBox?

Failure Mechanisms in MEMS/NEMS Devices by Bhushan, Bharat is a scholarly article available to read on EtoBox.

What is Failure Mechanisms in MEMS/NEMS Devices about?

Established as the definitive reference in the nanoscience and nanotechnology area this new edition reflects further developments on the subject in one expanded volume. The latest information is added to rapidly evolving fields such as bionanotechnology, nanorobotics, and NEMS/MEMS reliability.

Author

Bhushan, Bharat

Publisher

Springer Berlin Heidelberg

Published

2007

Language

EN

ISBN

9783540298571