About this scholarly article

ECS Transactions [ECS China Semiconductor Technology International Conference 2010 (CSTIC 2010) - Shanghai, China (March 18 - March 19, 2010)] - Impact of Radiation on the Operation and Reliability of Deep Submicron CMOS Technologies by Claeys, Cor; Put, Sofie; Griffoni, Alessio; Cester, Andrea; Gerardin, Simone; Meneghesso, G.; Paccagnella, Alessandro; Simoen, Eddy is a scholarly article available to read on EtoBox.

Author

Claeys, Cor; Put, Sofie; Griffoni, Alessio; Cester, Andrea; Gerardin, Simone; Meneghesso, G.; Paccagnella, Alessandro; Simoen, Eddy

Publisher

ECS

Published

2010

Language

EN