About this scholarly article

31st European Solid-State Device Research Conference - Ultra-low noise strained Si/SiGe n- and Ge/SiGe p-MODFETs by Enciso, M.; Fox, A.; Aniel, F.; Crozat, P.; Giguerre, L.; Adde, R.; Zeuner, M.; Hock, G. is a scholarly article available to read on EtoBox.

Author

Enciso, M.; Fox, A.; Aniel, F.; Crozat, P.; Giguerre, L.; Adde, R.; Zeuner, M.; Hock, G.

Publisher

IEEE

Published

2001