About this scholarly article

2008 Symposium on VLSI Technology - TSNWFET for SRAM cell application: Performance variation and process dependency by Sung Dae Suk, ; Yun Young Yeoh, ; Ming Li, ; Kyoung Hwan Yeo, ; Sung-Han Kim, ; Dong-Won Kim, ; Park, Donggun; Won-Seoung Lee, is a scholarly article available to read on EtoBox.

Author

Sung Dae Suk, ; Yun Young Yeoh, ; Ming Li, ; Kyoung Hwan Yeo, ; Sung-Han Kim, ; Dong-Won Kim, ; Park, Donggun; Won-Seoung Lee,

Publisher

IEEE

Published

2008

Language

EN