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About this Engineering article

Effects of arsenic concentration on the formation of dislocation loops near the projected ion range in high-dose As+-implanted (001) Si by Hsu, S. N.; Chen, L. J. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Hsu, S. N.; Chen, L. J.
Publisher
American Institute of Physics; AIP Publishing (ISSN 0003-6951)
Published
1989
Language
EN
Field
Engineering (Physical Sciences)