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About this Materials Science article
Atomic Force Microscopy with Nanoelectrode Tips for High Resolution Electrochemical, Nanoadhesion and Nanoelectrical Imaging by Nellist, Michael R; Chen, Yikai; Mark, Andreas; Gödrich, Sebastian; Stelling, Christian; Jiang, Jingjing; Poddar, Rakesh; Li, Chunzeng; Kumar, Ravi; Papastavrou, Georg; Retsch, Markus; Brunschwig, Bruce S; Huang, Zhuangqun; Xiang, Chengxiang; Boettcher, Shannon W is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Nellist, Michael R; Chen, Yikai; Mark, Andreas; Gödrich, Sebastian; Stelling, Christian; Jiang, Jingjing; Poddar, Rakesh; Li, Chunzeng; Kumar, Ravi; Papastavrou, Georg; Retsch, Markus; Brunschwig, Bruce S; Huang, Zhuangqun; Xiang, Chengxiang; Boettcher, Shannon W
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0957-4484)
- Published
- 2017
- Field
- Materials Science (Physical Sciences)