About this scholarly article

20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05) - Should Illinois-scan based architectures be centralized or distributed? by Al-Yamani, A.; Devta-Prasanna, N.; Gunda, A. is a scholarly article available to read on EtoBox.

Author

Al-Yamani, A.; Devta-Prasanna, N.; Gunda, A.

Publisher

IEEE Comput. Soc

Published

2005