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MOSIS Wafer Acceptance Test Results by Praveen Vs is a document available to read on EtoBox.

What is MOSIS Wafer Acceptance Test Results about?

This document contains test results for a fabrication lot including transistor parameters such as minimum Vth, Ids, and mobility, as well as process parameters like sheet resistance and contact resistance. It also includes capacitor parameters like area and fringe capacitance for different device components. Circuit parameters like inverter gain and ring oscillator frequency and power are reported.

Author

Praveen Vs

Language

EN