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About this Engineering article
Fatigue-induced interface damage in Cu/V nanoscale metallic multilayers by Wei, Siyuan; Zhao, Zhiyu; Zheng, Shijian; Wei, Hua; Wang, Jiangwei is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Wei, Siyuan; Zhao, Zhiyu; Zheng, Shijian; Wei, Hua; Wang, Jiangwei
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 1359-6462)
- Published
- 2021
- Field
- Engineering (Physical Sciences)
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