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This document discusses process variation modeling techniques for statistical timing analysis (STA) in advanced process nodes. It outlines four key challenges with traditional approaches: 1) not accounting for slew/load impact on delay variation, 2) overestimating common point variation, 3) not modeling correlation between slew and delay variation, and 4) adding constraint and delay variations linearly. The document proposes solutions using parametric on-chip variation (POCV) modeling to address each challe

Author
chaitanya
Language
EN

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