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Fluorine in low-pressure chemical vapor deposited W/Si contact structures: Inclusion and thermal stability by Whitlow, H. J.; Eriksson, Th.; Östling, M.; Petersson, C. S.; Keinonen, J.; Anttila, A is a Engineering article available to read on EtoBox.

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Author
Whitlow, H. J.; Eriksson, Th.; Östling, M.; Petersson, C. S.; Keinonen, J.; Anttila, A
Publisher
American Institute of Physics; AIP Publishing (ISSN 0003-6951)
Published
1987
Language
EN
Field
Engineering (Physical Sciences)

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