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Nanotips Prepared by Ion or Cluster Impacts for Flat Panel Displays by Paul A. Thevenard; Jean-Pierre Dupin; Binh Vu Thien; Stephen T. Purcell; Vincent Semet is a Engineering article available to read on EtoBox.

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Surface modifications of refractory oxide materials covered with a thin layer of metal were produced by bombarding the metal surface with GeV heavy ions or 20᎐40 MeV cluster C q beams. The goal is to realize nanotips at the surface to get new electron 60 Ž . emission devices with low applied voltages. The nanotips were produced on free surfaces of refractory oxides TiO , Al O by 2 2 3 energetic GeV ions or 20᎐40 MeV C cluster beams. They were characterized by atomic force microscopy and transmission 60 Ž . electron microscopy. Protrusions of nanometer sizes 1᎐20 nm were observed at the surface. The nanotips result from the damage induced by the high level of electronic energy losses leading to the local amorphization of the oxide that surrounded the Ž . particle trajectories. To realize an electron emission device a thin layer of metal Pt was deposited onto the refractory oxide surface prior to the ion or cluster bombardment. First experiments on electron emission from such bombarded surfaces were performed. Electron emission was observed above a low threshold field with excellent stability even in vacuum to 10 y7 torr. The electron energy spectrum was also measured. All these new

Who reads Nanotips Prepared by Ion or Cluster Impacts for Flat Panel Displays?

It is typically read by researchers, students, and practitioners in Engineering.

Author
Paul A. Thevenard; Jean-Pierre Dupin; Binh Vu Thien; Stephen T. Purcell; Vincent Semet
Publisher
Elsevier Science; Elsevier ; Elsevier BV (ISSN 0257-8972)
Published
2000
Language
EN
Field
Engineering (Physical Sciences)

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