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About this Materials Science article
Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy by Palleau, E; Ressier, L; Borowik, Å; Mélin, T is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Palleau, E; Ressier, L; Borowik, Å; Mélin, T
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0957-4484)
- Published
- 2010
- Field
- Materials Science (Physical Sciences)
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