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Fabrication of Tunnel Junctions for Direct Detector Arrays with Single-electron Transistor Readout Using Electron-beam Lithography by Stevenson, T.R.; Wen-Ting Hsieh, ; Li, M.J.; Rhee, K.W.; Schoelkopf, R.J.; Stahle, C.M.; Teufel, J.D. is a Engineering article available to read on EtoBox.

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Author
Stevenson, T.R.; Wen-Ting Hsieh, ; Li, M.J.; Rhee, K.W.; Schoelkopf, R.J.; Stahle, C.M.; Teufel, J.D.
Publisher
IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1051-8223)
Published
2003
Language
EN
Field
Engineering (Physical Sciences)

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