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VLSI Testing and Fault Analysis Guide by Saumya Jain is a document available to read on EtoBox.

What is VLSI Testing and Fault Analysis Guide about?

This document contains questions from multiple modules related to VLSI testing. It addresses topics like the role of testing in the VLSI design flow, differences between VLSI and classical testing, types of tests that can be performed on logic gates. It also discusses functional testing and its limitations, how structural testing addresses these issues, and the need for design for testability circuitry. Additional questions cover fault models, characteristics of good models, and why stuck-at faults are wide

Author

Saumya Jain

Language

EN