About this scholarly article

2016 IEEE 18th Electronics Packaging Technology Conference (EPTC) - Determination of dielectric thickness, constant, and loss tangent from cavity resonators by Engin, A. Ege; Ndip, Ivan; Lang, Klaus-Dieter; Aguirre, Jerry is a scholarly article available to read on EtoBox.

Author

Engin, A. Ege; Ndip, Ivan; Lang, Klaus-Dieter; Aguirre, Jerry

Publisher

IEEE

Published

2016