About this scholarly article

New ERA: new efficient reliability-aware wear leveling for endurance enhancement of flash storage devices by Ming-Chang Yang; Yuan-Hao Chang; Che-Wei Tsao; Po-Chun Huang is a scholarly article available to read on EtoBox.

Author

Ming-Chang Yang; Yuan-Hao Chang; Che-Wei Tsao; Po-Chun Huang

Publisher

ACM

Published

2013

Language

EN