Skip to content

Opening book details…

About this Engineering article

Enhanced Gold Diffusion in Silicon under Intrinsic Point Defect Flow by Koveshnikov, Sergei V.; Yakimov, E.B.; Yarykin, Nikolai is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Koveshnikov, Sergei V.; Yakimov, E.B.; Yarykin, Nikolai
Publisher
Trans Tech Publications, Ltd.; Trans Tech Publications Ltd (ISSN 1662-9507)
Published
1993
Field
Engineering (Physical Sciences)

More by Koveshnikov, Sergei V.; Yakimov, E.B.; Yarykin, Nikolai

Browse all works by Koveshnikov, Sergei V.; Yakimov, E.B.; Yarykin, Nikolai