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About this Engineering article
Fatigue Strength of Ultrafine Grained Copper Treated by Post-ECAP Mild Annealing by Goto, Masahiro; Nakashima, Kazuya; Han, Seung Zeon; Yokoho, Yuji; Euh, Kwang Jun; Kawagoishi, Norio is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Goto, Masahiro; Nakashima, Kazuya; Han, Seung Zeon; Yokoho, Yuji; Euh, Kwang Jun; Kawagoishi, Norio
- Publisher
- Trans Tech Publications, Ltd.; Trans Tech Publications (ISSN 1662-8958)
- Published
- 2011
- Language
- EN
- Field
- Engineering (Physical Sciences)