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About this Physics and Astronomy article
AIP Conference Proceedings - Drain and Gate Current LF Noise in Advanced CMOS devices with Ultrathin gate Oxides by Contaret, T. is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Contaret, T.
- Publisher
- AIP
- Published
- 2005
- Field
- Physics and Astronomy (Physical Sciences)