Skip to content

Opening book details…

About this Engineering article

Investigation on Base-Emitter Reverse Biasing: Light Emission, Junction Cross-Talk and Hot Carriers in Single-Polysilicon Quasi Self-Aligned Bipolar-Complementary Metal-Oxide Semiconductor Bipolar Transistors by Vendrame, L.; Ailloud, L.; Pontcharra, J. De; Gravier, T.; Niel, S.; Kirtsch, J.; Chantre, A. is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Vendrame, L.; Ailloud, L.; Pontcharra, J. De; Gravier, T.; Niel, S.; Kirtsch, J.; Chantre, A.
Publisher
Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
Published
1999
Field
Engineering (Physical Sciences)

More by Vendrame, L.; Ailloud, L.; Pontcharra, J. De; Gravier, T.; Niel, S.; Kirtsch, J.; Chantre, A.

Browse all works by Vendrame, L.; Ailloud, L.; Pontcharra, J. De; Gravier, T.; Niel, S.; Kirtsch, J.; Chantre, A.