About this scholarly article

Proceedings of the 2013 9th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) - Application of Bayesian networks to predict SMART power semiconductor lifetime by Plankensteiner, Kathrin; Bluder, Olivia; Pilz, Jurgen is a scholarly article available to read on EtoBox.

Author

Plankensteiner, Kathrin; Bluder, Olivia; Pilz, Jurgen

Publisher

IEEE

Published

2013

Language

EN