About this scholarly article

2005 5th International Conference on Microwave Electronics: Measurement, Identification, Applications - The Potential of Flat Curvilinear Doe as a Key Element of Future Integrated Diffractive Optics and Information Protected Element by Minin, I.V.; Minin, O.V.; Prather, D.; Shi, S. is a scholarly article available to read on EtoBox.

Author

Minin, I.V.; Minin, O.V.; Prather, D.; Shi, S.

Publisher

IEEE

Published

2005

Language

EN