About this scholarly article

SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Wafer pattern inspection using a Coherent Optical Processor by Cai, Xian-Yang; Kvasnik, Frank; D'Amato, Donald P.; Blanz, Wolf-Ekkehard; Dom, Byron E.; Srihari, Sargur N. is a scholarly article available to read on EtoBox.

Author

Cai, Xian-Yang; Kvasnik, Frank; D'Amato, Donald P.; Blanz, Wolf-Ekkehard; Dom, Byron E.; Srihari, Sargur N.

Publisher

SPIE

Published

1992