Opening book details…
About this Engineering article
Annealing of Irreversible Defects in Hydrogenated and Unhydrogenated Amorphous Silicon Thin Films by Parsons, G. N.; Wang, C.; Lucovsky, G. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Parsons, G. N.; Wang, C.; Lucovsky, G.
- Publisher
- Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP) (ISSN 0272-9172)
- Published
- 1990
- Language
- EN
- Field
- Engineering (Physical Sciences)