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About this Engineering article
Simulation and measurement of residual stress and warpage in a HgCdTe-based infrared detector at 100 K by Duperrex, Lucas (author);Pesci, Raphaël (author);Le Boterf, Pascal (author);Mailliart, Olivier (author) is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Duperrex, Lucas (author);Pesci, Raphaël (author);Le Boterf, Pascal (author);Mailliart, Olivier (author)
- Publisher
- Elsevier BV
- Published
- 2021
- Field
- Engineering (Physical Sciences)