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About this Engineering article
Method of estimating mechanical stress on Si body of MOSFET using drain–body junction current by Seo, Ji-Hoon; Kim, Gang-Jun; Son, Donghee; Lee, Nam-Hyun; Kang, Bongkoo is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Seo, Ji-Hoon; Kim, Gang-Jun; Son, Donghee; Lee, Nam-Hyun; Kang, Bongkoo
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 2017
- Language
- EN
- Field
- Engineering (Physical Sciences)
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